skip to content
Preview this item
ClosePreview this item
Checking...

Modelling of temporal temperature and pressure change due to partial discharge events within a spherical cavity in a solid dielectric material using finite element analysis

Author: Hazlee A Illias Affiliation: School of Electronic and Computer Science, University of Southampton, UK; George Chen Affiliation: School of Electronic and Computer Science, University of Southampton, UK; Paul L Lewin Affiliation: School of Electronic and Computer Science, University of Southampton, UK
Edition/Format: Chapter
Database:IEEE Publications Database
Summary:
Partial discharge (PD) events within a closed-volume cavity in a dielectric material can cause a temperature change in the cavity. This may influence the occurrence of following PDs because the pressure in the cavity is affected, which changes the inception voltage level for the next PD. In this paper, a two-dimensional axial symmetric model geometry consisting of a spherical cavity within a homogeneous dielectric  Read more...
Rating:

(not yet rated) 0 with reviews - Be the first.

 

Find a copy online

Links to this item

Find a copy in the library

We were unable to get information about libraries that hold this item.

Details

All Authors / Contributors: Hazlee A Illias Affiliation: School of Electronic and Computer Science, University of Southampton, UK; George Chen Affiliation: School of Electronic and Computer Science, University of Southampton, UK; Paul L Lewin Affiliation: School of Electronic and Computer Science, University of Southampton, UK
ISBN: 978-1-4244-8286-3 978-1-4244-8283-2 978-1-4244-8285-6
Publication:2010 International Conference on High Voltage Engineering and Application; 501-504
Unique Identifier: 4801751131
Awards:

Abstract:

Partial discharge (PD) events within a closed-volume cavity in a dielectric material can cause a temperature change in the cavity. This may influence the occurrence of following PDs because the pressure in the cavity is affected, which changes the inception voltage level for the next PD. In this paper, a two-dimensional axial symmetric model geometry consisting of a spherical cavity within a homogeneous dielectric material has been developed using Finite Element Analysis (FEA) method. The model has been used to simulate the temperature distribution in the cavity before and after a PD. The variation in the temperature distribution is implemented in the PD model to study the influence of temperature and pressure change in the cavity due to a discharge on the sequence of PD events.

Reviews

User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.
Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/4801751131> # Modelling of temporal temperature and pressure change due to partial discharge events within a spherical cavity in a solid dielectric material using finite element analysis
a bgn:Chapter, schema:CreativeWork ;
library:oclcnum "4801751131" ;
rdfs:comment "949 $l IEEE Conference" ;
rdfs:comment "949 $l Chapter" ;
schema:about <http://experiment.worldcat.org/entity/work/data/1072995462#Thing/dielectric_materials> ; # dielectric materials
schema:about <http://experiment.worldcat.org/entity/work/data/1072995462#Thing/heating> ; # Heating
schema:about <http://experiment.worldcat.org/entity/work/data/1072995462#Thing/partial_discharge_events> ; # partial discharge events
schema:about <http://experiment.worldcat.org/entity/work/data/1072995462#Thing/temporal_temperature_distribution> ; # temporal temperature distribution
schema:about <http://experiment.worldcat.org/entity/work/data/1072995462#Thing/pressure> ; # pressure
schema:about <http://experiment.worldcat.org/entity/work/data/1072995462#Thing/fea_method> ; # FEA method
schema:about <http://experiment.worldcat.org/entity/work/data/1072995462#Thing/temperature_distribution> ; # Temperature distribution
schema:about <http://experiment.worldcat.org/entity/work/data/1072995462#Thing/finite_element_analysis> ; # finite element analysis
schema:about <http://experiment.worldcat.org/entity/work/data/1072995462#Thing/pressure_change> ; # pressure change
schema:about <http://experiment.worldcat.org/entity/work/data/1072995462#Thing/materials> ; # Materials
schema:about <http://experiment.worldcat.org/entity/work/data/1072995462#Thing/discharges> ; # Discharges
schema:about <http://experiment.worldcat.org/entity/work/data/1072995462#Thing/spherical_cavity> ; # spherical cavity
schema:about <http://experiment.worldcat.org/entity/work/data/1072995462#Thing/partial_discharges> ; # Partial discharges
schema:about <http://experiment.worldcat.org/entity/work/data/1072995462#Thing/cavity_resonators> ; # Cavity resonators
schema:about <http://experiment.worldcat.org/entity/work/data/1072995462#Thing/solid_dielectric_material> ; # solid dielectric material
schema:about <http://experiment.worldcat.org/entity/work/data/1072995462#Thing/mathematical_model> ; # Mathematical model
schema:contributor <http://experiment.worldcat.org/entity/work/data/1072995462#Meeting/2010_international_conference_on_high_voltage_engineering_and_application_ichve_new_orleans_la_usa_2010_oct_11_2010_oct_14> ; # 2010 International Conference on High Voltage Engineering and Application (ICHVE) New Orleans, LA, USA 2010 Oct. 11 - 2010 Oct. 14
schema:contributor <http://experiment.worldcat.org/entity/work/data/1072995462#Person/lewin_paul_l> ; # Paul L. Lewin
schema:contributor <http://experiment.worldcat.org/entity/work/data/1072995462#Person/chen_george> ; # George Chen
schema:creator <http://experiment.worldcat.org/entity/work/data/1072995462#Person/illias_hazlee_a> ; # Hazlee A. Illias
schema:description "Partial discharge (PD) events within a closed-volume cavity in a dielectric material can cause a temperature change in the cavity. This may influence the occurrence of following PDs because the pressure in the cavity is affected, which changes the inception voltage level for the next PD. In this paper, a two-dimensional axial symmetric model geometry consisting of a spherical cavity within a homogeneous dielectric material has been developed using Finite Element Analysis (FEA) method. The model has been used to simulate the temperature distribution in the cavity before and after a PD. The variation in the temperature distribution is implemented in the PD model to study the influence of temperature and pressure change in the cavity due to a discharge on the sequence of PD events." ;
schema:exampleOfWork <http://worldcat.org/entity/work/id/1072995462> ;
schema:name "Modelling of temporal temperature and pressure change due to partial discharge events within a spherical cavity in a solid dielectric material using finite element analysis" ;
schema:pageEnd "504" ;
schema:pageStart "501" ;
schema:productID "4801751131" ;
schema:sameAs <http://dx.doi.org/10.1109/ICHVE.2010.5640716> ;
schema:url <http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5640716> ;
wdrs:describedby <http://www.worldcat.org/title/-/oclc/4801751131> ;
.


Related Entities

<http://experiment.worldcat.org/entity/work/data/1072995462#Meeting/2010_international_conference_on_high_voltage_engineering_and_application_ichve_new_orleans_la_usa_2010_oct_11_2010_oct_14> # 2010 International Conference on High Voltage Engineering and Application (ICHVE) New Orleans, LA, USA 2010 Oct. 11 - 2010 Oct. 14
a bgn:Meeting, schema:Event ;
schema:location <http://experiment.worldcat.org/entity/work/data/1072995462#Place/new_orleans_la_usa> ; # New Orleans, LA, USA
schema:name "2010 International Conference on High Voltage Engineering and Application (ICHVE) New Orleans, LA, USA 2010 Oct. 11 - 2010 Oct. 14" ;
.

<http://experiment.worldcat.org/entity/work/data/1072995462#Thing/partial_discharges> # Partial discharges
a schema:Thing ;
schema:name "Partial discharges" ;
schema:name "partial discharges" ;
.

<http://experiment.worldcat.org/entity/work/data/1072995462#Thing/temperature_distribution> # Temperature distribution
a schema:Thing ;
schema:name "Temperature distribution" ;
schema:name "temperature distribution" ;
.

<http://experiment.worldcat.org/entity/work/data/1072995462#Thing/temporal_temperature_distribution> # temporal temperature distribution
a schema:Thing ;
schema:name "temporal temperature distribution" ;
.

<http://www.worldcat.org/title/-/oclc/4801751131>
a genont:InformationResource, genont:ContentTypeGenericResource ;
schema:about <http://www.worldcat.org/oclc/4801751131> ; # Modelling of temporal temperature and pressure change due to partial discharge events within a spherical cavity in a solid dielectric material using finite element analysis
schema:dateModified "2017-03-15" ;
void:inDataset <http://purl.oclc.org/dataset/ieee_xplore> ;
.


Content-negotiable representations

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.